APA (7th ed.) Citation

Han, K. K. (1998). Electrical and structural characterisation of rapid thermal annealed RF sputtered silicon oxide films.

Chicago Style (17th ed.) Citation

Han, King Kwang. Electrical and Structural Characterisation of Rapid Thermal Annealed RF Sputtered Silicon Oxide Films. 1998.

MLA (8th ed.) Citation

Han, King Kwang. Electrical and Structural Characterisation of Rapid Thermal Annealed RF Sputtered Silicon Oxide Films. 1998.

Warning: These citations may not always be 100% accurate.