APA引文

Han, K. K. (1998). Electrical and structural characterisation of rapid thermal annealed RF sputtered silicon oxide films.

Chicago Style (17th ed.) Citation

Han, King Kwang. Electrical and Structural Characterisation of Rapid Thermal Annealed RF Sputtered Silicon Oxide Films. 1998.

MLA引文

Han, King Kwang. Electrical and Structural Characterisation of Rapid Thermal Annealed RF Sputtered Silicon Oxide Films. 1998.

警告：這些引文格式不一定是100％准確.