Degradation and annealing of electrically-stressed thin oxide in MOS devices /
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| Main Author: | |
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| Format: | Thesis Book |
| Language: | English |
| Published: |
1998.
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| Subjects: | |
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| Item Description: | Spine title: Electrically-stressed thin oxide in MOS devices. |
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| Physical Description: | xvi, 94 leaves : ill. ; 30 cm. |
| Bibliography: | Includes bibliographical references. |