APA引文

Loong, S. Y. (1999). Development of in-line analytical monitoring techniques for IC device fabrication.

Chicago Style (17th ed.) Citation

Loong, Sang Yee. Development of In-line Analytical Monitoring Techniques for IC Device Fabrication. 1999.

MLA引文

Loong, Sang Yee. Development of In-line Analytical Monitoring Techniques for IC Device Fabrication. 1999.

警告：这些引文格式不一定是100％准确.