Hot-carrier studies in submicrometer SOI and conventional MOSFETs /

مواد مشابهة

• Characterization of hot-carrier degradation in submicrometer MOS transistors /
  بواسطة: Ang, Diing Shenp
  منشور في: (1997)
• Hot-carrier characterization of submicrometer MOS transistors : subthreshold degradation and channel-width effect /
  بواسطة: Qin, Wei Han
  منشور في: (1998)
• Hot-carrier effects in thin gate oxide MOSFET's /
  بواسطة: See, Leng Kian
  منشور في: (1998)
• Hot-carrier degradation study in MOSFET's by charge pumping, gated-diode and floating gate techniques /
  بواسطة: Goh, Yong Han
  منشور في: (1997)
• Evaluation of hot-carrier degradation in submicrometre MOSFETs by gate capacitance and charge pumping current measurements /
  بواسطة: Tan, Suat Eng
  منشور في: (1997)