Plasma charge damage in submicron process /

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Bibliographic Details
Main Author: Song, Jun
Format: Thesis Book
Language:English
Published: 1999.
Subjects:
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LEADER 00790cam a2200241 a 4500
001 u451886
003 SIRSI
008 000224s1999 si v 00 1 eng m
035 |a ACI-9971 
040 |a UMM 
090 |a TK7871.85  |b Son 
100 1 0 |a Song, Jun. 
245 1 0 |a Plasma charge damage in submicron process /  |c by Song Jun. 
260 |c 1999. 
300 |a xxi, 101 leaves :  |b ill. ;  |c 30 cm. 
502 |a Dissertation (M.Eng.) -- National University of Singapore, 1999. 
504 |a Bibliography: leaves 95-96. 
650 0 |a Semiconductors  |x Effect of radiation of. 
650 0 |a Plasma etching  |x Industrial applications 
650 0 |a Semiconductors  |x Etching 
948 |a 26/02/2000  |b 16/05/2000 
596 |a 1 
999 |a TK7871.85 SON  |w LC  |c 1  |i A509511684  |l STACKS  |m P01UTAMA  |r Y  |s Y  |t TESIS  |u 1/6/2000