APA (7th ed.) Citation

Xie, P. (2000). A golden-block based scheme for continuous pattered wafer inspection.

Chicago Style (17th ed.) Citation

Xie, Pin. A Golden-block Based Scheme for Continuous Pattered Wafer Inspection. 2000.

MLA (8th ed.) Citation

Xie, Pin. A Golden-block Based Scheme for Continuous Pattered Wafer Inspection. 2000.

Warning: These citations may not always be 100% accurate.