Ma, S. (1999). Tunneling in reliability study of MOS structures.
Chicago Style (17th ed.) CitationMa, Siguang. Tunneling in Reliability Study of MOS Structures. 1999.
MLA引文Ma, Siguang. Tunneling in Reliability Study of MOS Structures. 1999.
警告:這些引文格式不一定是100%准確.