APA引文

Yue, J. M. P. (2000). A study on the hot-carrier degradation of wide and narrow channel nmosfet devices with recessed-locos isolation structures.

Chicago Style (17th ed.) Citation

Yue, Jeffrey Mun Pun. A Study on the Hot-carrier Degradation of Wide and Narrow Channel Nmosfet Devices with Recessed-locos Isolation Structures. 2000.

MLA引文

Yue, Jeffrey Mun Pun. A Study on the Hot-carrier Degradation of Wide and Narrow Channel Nmosfet Devices with Recessed-locos Isolation Structures. 2000.

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