Yue, J. M. P. (2000). A study on the hot-carrier degradation of wide and narrow channel nmosfet devices with recessed-locos isolation structures.
Chicago Style (17th ed.) CitationYue, Jeffrey Mun Pun. A Study on the Hot-carrier Degradation of Wide and Narrow Channel Nmosfet Devices with Recessed-locos Isolation Structures. 2000.
MLA (8th ed.) CitationYue, Jeffrey Mun Pun. A Study on the Hot-carrier Degradation of Wide and Narrow Channel Nmosfet Devices with Recessed-locos Isolation Structures. 2000.
Warning: These citations may not always be 100% accurate.