A study on the hot-carrier degradation of wide and narrow channel nmosfet devices with recessed-locos isolation structures /
Saved in:
| Main Author: | |
|---|---|
| Format: | Thesis Book |
| Language: | English |
| Published: |
2000.
|
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Item Description: | Photocopy. |
|---|---|
| Physical Description: | xviii, 144 leaves : ill. ; 30 cm. |
| Bibliography: | Bibliography: leaves 137-144. |