Effects of RF power and annealing on the properties of RF sputtered amorphous silicon carbide films /

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Bibliographic Details
Main Author: Chong, Nyok Boon
Format: Thesis Book
Language:English
Published: 2000.
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035 |a ACR-5273 
040 |a UMM 
090 |a TK7  |b NUS 2000 Cho 
100 1 0 |a Chong, Nyok Boon. 
245 1 0 |a Effects of RF power and annealing on the properties of RF sputtered amorphous silicon carbide films /  |c by Chong Nyok Boon. 
260 |c 2000. 
300 |a xii, 121 leaves :  |b ill. ;  |c 30 cm. 
502 |a Dissertation (M.Eng.) -- National University of Singapore, 2000. 
504 |a Bibliography: leaves 62-70. 
948 |a 05/11/2001  |b 05/11/2002 
596 |a 1 
999 |a TK7 NUS 2000 CHO  |w LC  |c 1  |i A510539429  |d 18/4/2008  |e 18/4/2008  |l B_KOM4  |m P01UTAMA  |n 1  |r Y  |s Y  |t TESIS  |u 13/11/2002  |o .PUBLIC. BKOM 4 : 45407