Instrumentation development of an automated integrated test system (AITS) for the characterization of hot-carrier and oxide reliability /
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| 主要作者: | |
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| 格式: | Thesis 圖書 |
| 語言: | English |
| 出版: |
2000.
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| 003 | SIRSI | ||
| 008 | 990921s2000 si 00 0 eng | ||
| 035 | |a ACR-5276 | ||
| 040 | |a UMM | ||
| 090 | |a TK7 |b NUS 2000 Ng | ||
| 100 | 1 | 0 | |a Ng Tsu Hau. |
| 245 | 1 | 0 | |a Instrumentation development of an automated integrated test system (AITS) for the characterization of hot-carrier and oxide reliability / |c Ng Tsu Hau. |
| 260 | |c 2000. | ||
| 300 | |a xvi, 117 leaves : |b ill. ; |c 30 cm. | ||
| 502 | |a Dissertation (M.Eng.) -- National University of Singapore, 2000. | ||
| 504 | |a Bibliography : leaves 106-112. | ||
| 948 | |a 05/11/2001 |b 07/11/2002 | ||
| 596 | |a 1 | ||
| 999 | |a TK7 NUS 2000 NG |w LC |c 1 |i A510540793 |l B_KOM4 |m P01UTAMA |r Y |s Y |t TESIS |u 13/11/2002 |o .PUBLIC. bkom 4 : 45503 | ||
