Characterization of carrier lifetimes in semiconductors by the surface photovoltage technique /
Saved in:
| Main Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
2002.
|
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| LEADER | 00647cam a2200193 a 4500 | ||
|---|---|---|---|
| 001 | u503384 | ||
| 003 | SIRSI | ||
| 008 | 000929s2002 si v 00 1 eng m | ||
| 035 | |a ACV-5016 | ||
| 040 | |a UMM | ||
| 090 | |a TK7 |b NUS 2002 Zha | ||
| 100 | 1 | 0 | |a Zhang, Zhenhua. |
| 245 | 1 | 0 | |a Characterization of carrier lifetimes in semiconductors by the surface photovoltage technique / |c Zhang Zhenhua. |
| 260 | |c 2002. | ||
| 300 | |a ix, 87 leaves : |b ill. ; |c 30 cm. | ||
| 504 | |a Bibliography: leaves 85-87. | ||
| 948 | |a 22/08/2002 |b 07/11/2002 | ||
| 596 | |a 1 | ||
| 999 | |a TK7 NUS 2002 ZHA |w LC |c 1 |i A510775978 |l B_KOM4 |m P01UTAMA |r Y |s Y |t TESIS |u 28/11/2002 |o .PUBLIC. BKOM 4 : 46028 | ||