Tay, M. G. L. (2000). Characterisation of Ta2O5 thin films for sub-0.25um applications.
Chicago Style (17th ed.) CitationTay, Mark Gek Leng. Characterisation of Ta2O5 Thin Films for Sub-0.25um Applications. 2000.
MLA引文Tay, Mark Gek Leng. Characterisation of Ta2O5 Thin Films for Sub-0.25um Applications. 2000.
警告:這些引文格式不一定是100%准確.