Tan, Y. N. (2002). Stress-induced leakage current in thin oxides under high-field impulse stressing.
Chicago Style (17th ed.) CitationTan, Yan Ny. Stress-induced Leakage Current in Thin Oxides Under High-field Impulse Stressing. 2002.
MLA (8th ed.) CitationTan, Yan Ny. Stress-induced Leakage Current in Thin Oxides Under High-field Impulse Stressing. 2002.
Warning: These citations may not always be 100% accurate.