Zhuang, Z. (2002). Study on dual gate oxide integrity for system-on-a-chip technology.
Chicago Style (17th ed.) CitationZhuang, Ziyun. Study on Dual Gate Oxide Integrity for System-on-a-chip Technology. 2002.
MLA引文Zhuang, Ziyun. Study on Dual Gate Oxide Integrity for System-on-a-chip Technology. 2002.
警告：這些引文格式不一定是100％准確.