Study on dual gate oxide integrity for system-on-a-chip technology /

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Bibliographic Details
Main Author: Zhuang, Ziyun
Format: Thesis Book
Language:English
Published: 2002.
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035 |a ACW-0474 
040 |a UMM 
090 |a TK7  |b NUS 2002 Zhu 
100 1 0 |a Zhuang, Ziyun. 
245 1 0 |a Study on dual gate oxide integrity for system-on-a-chip technology /  |c by Zhuang Ziyun. 
260 |c 2002. 
300 |a viii, 68 leaves :  |b ill. ;  |c 30 cm. 
502 |a Dissertation (M.Eng.) -- National University of Singapore, 2002. 
504 |a Bibliography: leaves 65-66. 
948 |a 22/10/2002  |b 24/12/2002 
596 |a 1 
999 |a TK7 NUS 2002 ZHU  |w LC  |c 1  |i A510950055  |l B_KOM4  |m P01UTAMA  |r Y  |s Y  |t TESIS  |u 3/1/2003  |o .PUBLIC. BKOM 4 : 46012