APA引文

Yeo, S. B. (2002). Characterization of mos transistor mismatch for sub-micron process in analog application.

Chicago Style (17th ed.) Citation

Yeo, Siok Been. Characterization of Mos Transistor Mismatch for Sub-micron Process in Analog Application. 2002.

MLA引文

Yeo, Siok Been. Characterization of Mos Transistor Mismatch for Sub-micron Process in Analog Application. 2002.

警告：這些引文格式不一定是100％准確.