APA (7th ed.) Citation

Yeo, S. B. (2002). Characterization of mos transistor mismatch for sub-micron process in analog application.

Chicago Style (17th ed.) Citation

Yeo, Siok Been. Characterization of Mos Transistor Mismatch for Sub-micron Process in Analog Application. 2002.

MLA (8th ed.) Citation

Yeo, Siok Been. Characterization of Mos Transistor Mismatch for Sub-micron Process in Analog Application. 2002.

Warning: These citations may not always be 100% accurate.