Tay, M. G. L. (2000). Characterisation of Ta2O5 thin films for sub-0.25 um applications: Characterisation of Ta2O5 thin films for sub-0.25 um applications.
Chicago Style (17th ed.) CitationTay, Mark Gek Leng. Characterisation of Ta2O5 Thin Films for Sub-0.25 Um Applications: Characterisation of Ta2O5 Thin Films for Sub-0.25 Um Applications. 2000.
MLA引文Tay, Mark Gek Leng. Characterisation of Ta2O5 Thin Films for Sub-0.25 Um Applications: Characterisation of Ta2O5 Thin Films for Sub-0.25 Um Applications. 2000.
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