Study of gate oxide degradation using photon emission spectroscopy /
Saved in:
| Main Author: | |
|---|---|
| Format: | Thesis Book |
| Language: | English |
| Published: |
2002.
|
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| LEADER | 00707cam a2200205 a 4500 | ||
|---|---|---|---|
| 001 | u509140 | ||
| 003 | SIRSI | ||
| 008 | 000929s2002 si v 00 10 eng m | ||
| 035 | |a ACX-2271 | ||
| 040 | |a UMM | ||
| 090 | |a TK7 |b NUS 2002 Che | ||
| 100 | 1 | 0 | |a Chen, Kok Kiong |
| 245 | 1 | 0 | |a Study of gate oxide degradation using photon emission spectroscopy / |c by Chen Kok Kiong. |
| 260 | |c 2002. | ||
| 300 | |a xiii, 95 leaves : |b ill. ; |c 30 cm. | ||
| 502 | |a Dissertation (M.Eng.) -- National University of Singapore, 2002. | ||
| 504 | |a Bibliography: leaves 90-95. | ||
| 948 | |a 28/02/2003 |b 28/02/2003 | ||
| 596 | |a 1 | ||
| 999 | |a TK7 NUS 2002 CHE |w LC |c 1 |i A510987883 |l B_KOM4 |m P01UTAMA |r Y |s Y |t TESIS |u 11/3/2003 |o .PUBLIC. BKOM 4 : 45926 | ||