APA引文

Xia, J. (2002). I-V hysteresis characterization of deep-submicron mos devices.

Chicago Style (17th ed.) Citation

Xia, Jinghua. I-V Hysteresis Characterization of Deep-submicron Mos Devices. 2002.

MLA引文

Xia, Jinghua. I-V Hysteresis Characterization of Deep-submicron Mos Devices. 2002.

警告：這些引文格式不一定是100％准確.