Photoresist trimming technique in high-density oxygen-based plasmas for sub-0.1 um mosfet fabrication using 248-nm lithography /

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Bibliographic Details
Main Author: Sin, Chian Yuh
Format: Thesis Book
Language:English
Published: 2002.
Subjects:
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035 |a ACY-0750 
040 |a UMM 
090 |a TP7  |b NUS 2002 Sin 
100 1 0 |a Sin, Chian Yuh 
245 1 0 |a Photoresist trimming technique in high-density oxygen-based plasmas for sub-0.1 um mosfet fabrication using 248-nm lithography /  |c Sin Chian Yuh. 
260 |c 2002. 
300 |a xiii, 103 leaves :  |b ill. ;  |c 30 cm. 
502 |a Dissertation (M.Eng.) -- National University of Singapore, 2002. 
504 |a Bibliography: leaves 98-120. 
650 0 |a Photoresists. 
650 0 |a Microlithography. 
900 |a NHS 
948 |a 02/06/2003  |b 02/06/2003 
596 |a 1 
999 |a TP7 NUS 2002 SIN  |w LC  |c 1  |i A511117507  |l B_KOM4  |m P01UTAMA  |r Y  |s Y  |t TESIS  |u 5/6/2003  |o .PUBLIC. bkom 4 : 43268