APA (7th ed.) Citation

Chong, D. K. S. (2002). Study of plasma induced charging damage at CMOS gate process.

Chicago Style (17th ed.) Citation

Chong, Daniel Kien Seen. Study of Plasma Induced Charging Damage at CMOS Gate Process. 2002.

MLA (8th ed.) Citation

Chong, Daniel Kien Seen. Study of Plasma Induced Charging Damage at CMOS Gate Process. 2002.

Warning: These citations may not always be 100% accurate.