APA引文

Chong, D. K. S. (2002). Study of plasma induced charging damage at CMOS gate process.

Chicago Style (17th ed.) Citation

Chong, Daniel Kien Seen. Study of Plasma Induced Charging Damage at CMOS Gate Process. 2002.

MLA引文

Chong, Daniel Kien Seen. Study of Plasma Induced Charging Damage at CMOS Gate Process. 2002.

警告：這些引文格式不一定是100％准確.