APA引文

Lin, W. (2002). Fabrication and reliability study of ultrathin nitride/oxide gate stack and oxynitride.

Chicago Style (17th ed.) Citation

Lin, Wenhe. Fabrication and Reliability Study of Ultrathin Nitride/oxide Gate Stack and Oxynitride. 2002.

MLA引文

Lin, Wenhe. Fabrication and Reliability Study of Ultrathin Nitride/oxide Gate Stack and Oxynitride. 2002.

警告：這些引文格式不一定是100％准確.