Lin, W. (2002). Fabrication and reliability study of ultrathin nitride/oxide gate stack and oxynitride.
Chicago Style (17th ed.) CitationLin, Wenhe. Fabrication and Reliability Study of Ultrathin Nitride/oxide Gate Stack and Oxynitride. 2002.
MLA (8th ed.) CitationLin, Wenhe. Fabrication and Reliability Study of Ultrathin Nitride/oxide Gate Stack and Oxynitride. 2002.
Warning: These citations may not always be 100% accurate.