Studies on in-lens deflection systems for scanning electron-beam instruments /

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Bibliographic Details
Main Author: Zhao, Yan
Format: Thesis Book
Language:English
Published: 2000.
Subjects:
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035 |a ACV-5068 
040 |a UMM 
090 |a TK7  |b NUSP 2000 Zha 
100 1 0 |a Zhao, Yan. 
245 1 0 |a Studies on in-lens deflection systems for scanning electron-beam instruments /  |c Zhao Yan. 
260 |c 2000. 
300 |a xvi, 129 leaves :  |b ill. ;  |c 30 cm. 
502 |a Thesis (Ph.D.) -- Dept. of Electrical Engineering, Faculty of Engineering, National University of Singapore, 2000. 
504 |a Bibliography: leaves 108-112. 
650 0 |a Scanning electron microscopes. 
650 0 |a Light deflectors. 
948 |a 22/08/2002  |b 21/05/2004 
596 |a 1 
999 |a TK7 NUSP 2000 ZHA  |w LC  |c 1  |i A510763436  |d 10/7/2006  |f 10/7/2006  |g 1  |l B_KOM4  |m P01UTAMA  |r Y  |s Y  |t TESIS  |u 14/2/2005  |o .PUBLIC. BKOM 4 :43094