APA引文

Ang, C. H. (2000). Ultra-thin gate oxide reliability.

Chicago Style (17th ed.) Citation

Ang, Chew Hoe. Ultra-thin Gate Oxide Reliability. 2000.

MLA引文

Ang, Chew Hoe. Ultra-thin Gate Oxide Reliability. 2000.

警告：这些引文格式不一定是100％准确.