Ultra-thin gate oxide reliability /
Saved in:
| Main Author: | |
|---|---|
| Format: | Thesis Book |
| Language: | English |
| Published: |
2000.
|
| Subjects: | |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| LEADER | 00720cam a2200229 a 4500 | ||
|---|---|---|---|
| 001 | u691587 | ||
| 003 | SIRSI | ||
| 008 | 020917s2000 si v 00 1 eng m | ||
| 035 | |a ACV-9432 | ||
| 040 | |a UMM | ||
| 090 | |a TJ7 |b NUSP 2000 Ang | ||
| 100 | 1 | 0 | |a Ang, Chew Hoe. |
| 245 | 1 | 0 | |a Ultra-thin gate oxide reliability / |c Ang Chew Hoe. |
| 260 | |c 2000. | ||
| 300 | |a xxiii, 188 leaves : |b ill. ; |c 30 cm. | ||
| 502 | |a Thesis (Ph.D.) -- National University of Singapore, 2000. | ||
| 504 | |a Includes bibliographical references. | ||
| 650 | 0 | |a Protective coatings. | |
| 650 | 0 | |a Oxide coating. | |
| 948 | |a 10/10/2002 |b 12/07/2004 | ||
| 596 | |a 1 | ||
| 999 | |a TJ7 NUSP 2000 ANG |w LC |c 1 |i 691587-1001 |l INPROCESS |m P01UTAMA |r Y |s Y |t TESIS |u 15/2/2005 | ||