Enhanced stability of nickel silicide for advanced CMOS silicon technologies /

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Bibliographic Details
Main Author: Lee, Pooi See
Format: Thesis Book
Language:English
Published: 2001.
Subjects:
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035 |a ACW-2405 
040 |a UMM 
090 |a TA404.2  |b NUSP 2001 Lee 
100 1 0 |a Lee, Pooi See. 
245 1 0 |a Enhanced stability of nickel silicide for advanced CMOS silicon technologies /  |c Lee Pooi See. 
260 |c 2001. 
300 |a xvi, 244 leaves :  |b ill. ;  |c 30 cm. 
502 |a Thesis (Ph.D.) -- Dept. of Materials Science, Faculty of Science, National University of Singapore, 2001. 
504 |a Includes bibliographical references. 
650 0 |a Metal oxide semiconductors, Complementary. 
650 0 |a Silicides  |x Stability. 
948 |a 09/11/2002  |b 10/08/2004 
596 |a 1 
999 |a TA404.2 NUSP 2001 LEE  |w LC  |c 1  |i A510948728  |d 24/8/2006  |f 24/8/2006  |g 1  |l B_KOM4  |m P01UTAMA  |r Y  |s Y  |t TESIS  |u 14/2/2005