APA引文

Lun, Z. (2002). Electrical characterization of bulk traps and interface traps in the fully-depleted SOI MOSFET.

Chicago Style (17th ed.) Citation

Lun, Zhao. Electrical Characterization of Bulk Traps and Interface Traps in the Fully-depleted SOI MOSFET. 2002.

MLA引文

Lun, Zhao. Electrical Characterization of Bulk Traps and Interface Traps in the Fully-depleted SOI MOSFET. 2002.

警告：这些引文格式不一定是100％准确.