Electrical characterization of bulk traps and interface traps in the fully-depleted SOI MOSFET /
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| Main Author: | |
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| Format: | Thesis Book |
| Language: | English |
| Published: |
2002.
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| LEADER | 00934cam a2200229 a 4500 | ||
|---|---|---|---|
| 001 | u695443 | ||
| 003 | SIRSI | ||
| 008 | 040412s2002 si a v 00 10 eng m | ||
| 035 | |a ADA-8543 | ||
| 040 | |a UMM | ||
| 090 | |a TK7 |b NUSP 2002 Lun | ||
| 100 | 1 | 0 | |a Lun, Zhao. |
| 245 | 1 | 0 | |a Electrical characterization of bulk traps and interface traps in the fully-depleted SOI MOSFET / |c Lun Zhao. |
| 260 | |c 2002. | ||
| 300 | |a xviii, [165] leaves : |b ill. ; |c 30 cm. | ||
| 502 | |a Thesis (Ph.D.) -- Dept. of Electrical & Computer Engineering, Faculty of Engineering, National University of Singapore, 2002. | ||
| 504 | |a Includes bibliographical references. | ||
| 650 | 0 | |a Silicon-on-insulator technology. | |
| 650 | 0 | |a Metal oxide semiconductor field-effect transistors. | |
| 948 | |a 12/04/2004 |b 26/05/2004 | ||
| 596 | |a 1 | ||
| 999 | |a TK7 NUSP 2002 LUN |w LC |c 1 |i A511117427 |d 5/9/2006 |f 5/9/2006 |g 1 |l B_KOM4 |m P01UTAMA |r Y |s Y |t TESIS |u 2/8/2005 |o .PUBLIC. BKOM 4 :43125 | ||