STM investigation of the morphology and atomic structure of 6H-SiC(0001) surface /

Saved in:
Bibliographic Details
Main Author: Ong, Wei Jie
Format: Thesis Book
Language:English
Published: 2001.
Subjects:
Tags: Add Tag
No Tags, Be the first to tag this record!
LEADER 01016cam a2200253 a 4500
001 u695763
003 SIRSI
008 981209s2001 si v 0 eng m
035 |a ADB-0931 
040 |a UMM 
090 |a TA404.2  |b NUS 2001 Ong 
100 1 |a Ong, Wei Jie. 
245 1 0 |a STM investigation of the morphology and atomic structure of 6H-SiC(0001) surface /  |c Ong Wei Jie. 
246 3 |a Scanning tunneling microscope investigation of the morphology and atomic structure of 6H-SiC(0001) surface 
260 |c 2001. 
300 |a 171 leaves :  |b ill. ;  |c 30 cm. 
502 |a Dissertation (M.Sc.) -- Dept. of Materials Science, National University of Singapore, 2001. 
504 |a Bibliography: leaves 137-140. 
650 0 |a Silicon carbide  |x Surfaces. 
650 0 |a Scanning tunneling microscopy. 
710 2 0 |a National University of Singapore.  |b Dept. of Materials Science. 
900 |a ND 
596 |a 1 
999 |a TA404.2 NUS 2001 ONG  |w LC  |c 1  |i A503067194  |d 30/7/2007  |f 30/7/2007  |g 1  |l B_KOM4  |m P01UTAMA  |r Y  |s Y  |t TESIS  |u 25/7/2007