Wong, P. L. (2005). A reliability methodology for deep sub-micron interconnect metal liners.
Chicago Style (17th ed.) CitationWong, Poh Ling. A Reliability Methodology for Deep Sub-micron Interconnect Metal Liners. 2005.
MLA (8th ed.) CitationWong, Poh Ling. A Reliability Methodology for Deep Sub-micron Interconnect Metal Liners. 2005.
Warning: These citations may not always be 100% accurate.