APA引文

Wong, P. L. (2005). A reliability methodology for deep sub-micron interconnect metal liners.

Chicago Style (17th ed.) Citation

Wong, Poh Ling. A Reliability Methodology for Deep Sub-micron Interconnect Metal Liners. 2005.

MLA引文

Wong, Poh Ling. A Reliability Methodology for Deep Sub-micron Interconnect Metal Liners. 2005.

警告：这些引文格式不一定是100％准确.