Dependence of physical and electronic properties on the thickness of silicon dioxide thin films /
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| 主要作者: | |
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| 格式: | Thesis 图书 |
| 语言: | English |
| 出版: |
2005.
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| Item Description: | Supervised by Prof. Dr. Muhamad Rasat Muhamad. |
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| 实物描述: | xvii, 204 leaves : ill. ; 30 cm. |
| 参考书目: | Bibliography: leaves 191. |