Dependence of physical and electronic properties on the thickness of silicon dioxide thin films /
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Main Author: | |
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Format: | Thesis Book |
Language: | English |
Published: |
2005.
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LEADER | 00930cam a2200241 a 4500 | ||
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001 | u726047 | ||
003 | SIRSI | ||
005 | 200608111610 | ||
008 | 060811s2005 my t 000 0 eng m | ||
040 | |a UMM | ||
090 | |a QC3 |b UMP 2005 San | ||
100 | 0 | 0 | |a Sangar Subramaniam |
245 | 1 | 0 | |a Dependence of physical and electronic properties on the thickness of silicon dioxide thin films / |c by Sangar Subramaniam. |
260 | |c 2005. | ||
300 | |a xvii, 204 leaves : |b ill. ; |c 30 cm. | ||
500 | |a Supervised by Prof. Dr. Muhamad Rasat Muhamad. | ||
502 | |a Thesis (Ph.D.) -- Jabatan Fizik, Fakulti Sains, Universiti Malaya, 2005. | ||
504 | |a Bibliography: leaves 191. | ||
650 | 0 | |a Thin films |x Electric properties. | |
650 | 0 | |a Silicon alloys |x Electric properties. | |
710 | 2 | 0 | |a Universiti Malaya. |b Jabatan Fizik. |
596 | |a 1 | ||
999 | |a QC3 UMP 2005 SAN |w LC |c 1 |i A511940439 |d 22/8/2006 |f 22/8/2006 |g 1 |l STACKS |m P01UTAMA |r Y |s Y |t TESIS |u 22/8/2006 |