Dependence of physical and electronic properties on the thickness of silicon dioxide thin films /

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Bibliographic Details
Main Author: Sangar Subramaniam
Format: Thesis Book
Language:English
Published: 2005.
Subjects:
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040 |a UMM 
090 |a QC3  |b UMP 2005 San 
100 0 0 |a Sangar Subramaniam 
245 1 0 |a Dependence of physical and electronic properties on the thickness of silicon dioxide thin films /  |c by Sangar Subramaniam. 
260 |c 2005. 
300 |a xvii, 204 leaves :  |b ill. ;  |c 30 cm. 
500 |a Supervised by Prof. Dr. Muhamad Rasat Muhamad. 
502 |a Thesis (Ph.D.) -- Jabatan Fizik, Fakulti Sains, Universiti Malaya, 2005. 
504 |a Bibliography: leaves 191. 
650 0 |a Thin films  |x Electric properties. 
650 0 |a Silicon alloys  |x Electric properties. 
710 2 0 |a Universiti Malaya.  |b Jabatan Fizik. 
596 |a 1 
999 |a QC3 UMP 2005 SAN  |w LC  |c 1  |i A511940439  |d 22/8/2006  |f 22/8/2006  |g 1  |l STACKS  |m P01UTAMA  |r Y  |s Y  |t TESIS  |u 22/8/2006