A study of yield quantity discrepancy reduction in semi-conductor back-end process /

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Bibliographic Details
Main Author: Allina Abdullah
Format: Thesis Book
Language:English
Published: 2011.
Subjects:
Online Access:http://studentsrepo.um.edu.my/id/eprint/3134
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Description
Physical Description:xi, 68 leaves : ill. ; 30 cm.
Bibliography:Bibliography: leaves 61-66.