Characterization of pmosfet degradation in negative bias temperature instability test /
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| Main Author: | |
|---|---|
| Format: | Thesis Book |
| Language: | English |
| Published: |
2012.
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| Subjects: | |
| Online Access: | http://studentsrepo.um.edu.my/id/eprint/8383 |
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| 001 | u865789 | ||
| 003 | SIRSI | ||
| 005 | 201210021034 | ||
| 008 | 121002s2012 my a m 000 0 eng m | ||
| 040 | |a UMM |d UMJ |d AUM |e rda | ||
| 090 | |a TA7 |b UM 2012 Soo | ||
| 097 | |a TA7 |b UM 2012 Soo | ||
| 100 | 1 | |a Soon, Foo Yew, |e author. | |
| 245 | 1 | 0 | |a Characterization of pmosfet degradation in negative bias temperature instability test / |c Soon Foo Yew. |
| 264 | 1 | |c 2012. | |
| 264 | 4 | |c 2012. | |
| 300 | |a xxii, 118 leaves : |b illustrations ; |c 30 cm. | ||
| 336 | |a text |2 rdacontent | ||
| 337 | |a unmediated |2 rdamedia | ||
| 338 | |a volume |2 rdacarrier | ||
| 502 | |b M.Eng.Sc. |c Jabatan Kejuruteraan Elektrik, Fakulti Kejuruteraan, Universiti Malaya, 2012. | ||
| 504 | |a Bibliography: leaves 111-117. | ||
| 596 | |a 1 7 25 | ||
| 650 | 0 | |a Metal oxide semiconductor field-effect transistors. | |
| 650 | 0 | |a Metal oxide semiconductors, Complementary. | |
| 650 | 0 | |a Semiconductors. | |
| 650 | 0 | |a Microelectronics. | |
| 710 | 2 | |a Universiti Malaya. |b Jabatan Kejuruteraan Elektrik, |e degree granting institution. | |
| 856 | 4 | 1 | |u http://studentsrepo.um.edu.my/id/eprint/8383 |
| 900 | |a AT-ZA | ||
| 999 | |a TA7 UM 2012 SOO |w LC |c 1 |i A515293865 |d 13/6/2013 |f 13/6/2013 |g 1 |l STACKS |m P01UTAMA |r Y |s Y |t TESIS |u 11/6/2013 | ||
| 999 | |a TA7 UM 2012 SOO |w LC |c 1 |i A515564965 |d 12/7/2013 |f 12/7/2013 |g 1 |l STACKS |m P07JURUTER |r Y |s Y |t TESIS |u 9/7/2013 | ||
| 999 | |a TA7 UM 2012 SOO |w LC |c 1 |i A515564934 |d 12/7/2013 |f 12/7/2013 |g 1 |l STACKS |m P25UMARCHI |r N |s Y |t CD |u 9/7/2013 |1 STEM |o .STAFF. MST-CD1568 | ||