Development of design framework to overcome aging degradation of 16NM VLSI technology circuits /

Development of design framework to overcome aging degradation of 16NM VLSI technology circuits /

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Bibliographic Details
Main Author: Mahmoud, Mohamed Mounir
Format: Thesis Book
Language:English
Published: 2013.
Subjects:
Integrated circuits > Very large scale integration.
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Description
Physical Description:xiii, 101 leaves : ill. ; 30 cm.
Bibliography:Bibliography: leaves 98-101.

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