Lateral Diffused Metal Oxide Semiconductor (LDMOS) transistor Safe Operating Area (HCI-SOA) characterization under hot carrier injection /

Lateral Diffused Metal Oxide Semiconductor (LDMOS) transistor Safe Operating Area (HCI-SOA) characterization under hot carrier injection /

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Bibliographic Details
Main Author: Sharifah Shafini Syed Shahabuddin (Author)
Format: Thesis Book
Language:English
Published: 2013
Subjects:
Metal oxide semiconductors > Design and construction.
Integrated circuits > Design and construction.
Metal oxide semiconductor field-effect transistors.
Hot carriers.
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