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  1. 1
    Computer controlled transient capacitance measurement and analysis of deep levels in semiconductors /
    by Wu, Zongmin
    Published 1996
    Thesis Book
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  2. 2
    A study of deep levels in laser-prepared silicon rectifying junctions using a computer-controlled DLTS system /
    by Woon, Hin Swee
    Published 1988
    Thesis Book
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