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  1. 21
    Hot-carrier studies in submicrometer SOI and conventional MOSFETs /
    by Yip, Anselm
    Published 1998
    Thesis Book
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  2. 22
    Carrier lifetime characterization techniques in SOI and bulk silicon /
    by Cheng, Zhiyuan
    Published 1999
    Thesis Book
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  3. 23
    Latent damage generation in silicon dioxide under high-field impulse and constant-bias stressing /
    by Lim, Peng Soon
    Published 2001
    Thesis Book
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  4. 24
    Electrical characterization of bulk traps and interface traps in the fully-depleted SOI MOSFET /
    by Lun, Zhao
    Published 2002
    Thesis Book
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  5. 25
    Design and construction of charge pumping technique for MOS transistor characterization /
    by Lee, Hock Guan
    Published 2004
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    Thesis Book
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  6. 26
    The effect of doping concentration on the characteristics of n-channel MOSFET /
    by Teen, Soh Hong
    Published 2005
    Thesis Book
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  7. 27
    Optimization and characterization of 130 Nm CMOS transistor design using TCAD simulation /
    by Hani Noorashiqin Abd Majid
    Published 2007
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  8. 28
    A study of hot carrier degradation in LDMOS transistor /
    by Atikah Razi
    Published 2013
    Thesis Book
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  9. 29
    Impact of fabrication process on hot carrier injection in VDMOS transistor /
    by Murti, Wijaya Bayu
    Published 2013
    Thesis Book
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  10. 30
    A study on hot carrier effect (HCE) on LDD n-MOSFET /
    by Haziezol Helmi Mohd Yusof
    Published 2013
    Thesis Book
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  11. 31
    A study on the impact of processing parameters on silicon-on-insulator power MOSFET /
    by Noraziah Abd Wahab
    Published 2013
    Thesis Book
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  12. 32
    A study of long and short channel NMOSFET on threshold voltage /
    by Norseha Ariffin
    Published 2013
    Thesis Book
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  13. 33
    A study on the effects of design parameters on PD SOI MOSFET /
    by Nurul Azimah Ahmad Arzaai
    Published 2013
    Thesis Book
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