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Showing 1 - 4 results of 4 for search '"Integrated circuits Very large scale integration Testing."', 查询时间: 0.04s Refine Results
  1. 1
    Electron beam testing of integrated circuits using a modified scanning electron microscope /
    由 Sim, Kian Sin
    出版 1990
    主题: “...Integrated circuits Very large scale integration Testing....”
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  2. 2
    BIST based on reseeding of LFSRs /
    由 Venkataraman, Srikanth
    出版 1993
    主题: “...Integrated circuits Very large scale integration Testing...”
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  3. 3
    A built-in self-testable bit-slice processor /
    由 Ibrahim Abubakr M.
    出版 1995
    主题: “...Integrated circuits Very large scale integration Testing...”
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  4. 4
    Reka bentuk litar pengesan arus bagi pengujian logik dan iddq secara serentak /
    由 Fahmi Samsuri
    出版 2002
    主题: “...Integrated circuits Very large scale integration Testing...”
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