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  1. 1
    Pulse-duration dependent capacitance analysis and its application to copper in GaAs0.6P0.4 /
    由 Han, Meng Kwong
    出版 1994
    主题: “...Semiconductors Defects Measurement....”
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  2. 2
    Computer controlled transient capacitance measurement and analysis of deep levels in semiconductors /
    由 Wu, Zongmin
    出版 1996
    主题: “...Semiconductors Defects Measurement....”
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