BIST based on reseeding of LFSRs /

BIST based on reseeding of LFSRs /

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书目详细资料
主要作者:	Venkataraman, Srikanth
格式:	Thesis 图书
语言:	English
出版:	Montreal : McGill University, 1993
主题:	Digital integrated circuits > Testing Integrated circuits > Very large scale integration > Testing
标签:	添加标签没有标签, 成为第一个标记此记录!

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