Commercial SiGe and GaAs as low noise amplifiers (LNA) performance under electron radiation /

In this dissertation, a characterization and comparison between the effects of Electron irradiation on low noise amplifiers (LNAs) implemented in a Silicon-Germanium (SiGe) Heterojunction Bipolar Transistor (HBT) and Gallium-Arsenide (GaAs) HBT technologies, respectively, was carried out. Nowadays,...

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Bibliographic Details
Main Author: Youssouf, Abdouraouf Said (Author)
Format: Thesis
Language:English
Published: Kuala Lumpur : Kulliyyah of Engineering, International Islamic University Malaysia, 2016
Subjects:
Online Access:Click here to view 1st 24 pages of the thesis. Members can view fulltext at the specified PCs in the library.
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040 |a UIAM  |b eng  |e rda 
041 |a eng 
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100 1 |a Youssouf, Abdouraouf Said,  |e author 
245 1 |a Commercial SiGe and GaAs as low noise amplifiers (LNA) performance under electron radiation /  |c by Abdouraouf Said Youssouf 
264 1 |a Kuala Lumpur :  |b Kulliyyah of Engineering, International Islamic University Malaysia,  |c 2016 
300 |a xvi, 68 leaves :  |b illustrations ;  |c 30cm. 
336 |2 rdacontent  |a text 
502 |a Thesis (MSCE)--International Islamic University Malaysia, 2016. 
504 |a Includes bibliographical references (leaves 59-68). 
520 |a In this dissertation, a characterization and comparison between the effects of Electron irradiation on low noise amplifiers (LNAs) implemented in a Silicon-Germanium (SiGe) Heterojunction Bipolar Transistor (HBT) and Gallium-Arsenide (GaAs) HBT technologies, respectively, was carried out. Nowadays, commercial on the shelves (COTS) LNAs have been used in CubeSat communication system lunched in Low and Medium Earth Orbits. It therefore believed that the electron radiation in space may degrade the LNA's performance and lead to it failure. This is shows the importance of such investigation in evaluating and comparing the performance of the GaAs and SiGe LNAs which represent an important module in the front end of the communication receiver system. Two samples of GaAs and SiGe have been selected: the SiGe BFU730F and the ADL 5523 GaAs LNAs which are respectively cover a frequency range of 2.3 to 2.7 GHz and 400MHz to 4 GHz. The SiGe BFU730F achieves a peak gain of 21.5 dB and a peak of 0.8 dB noise figure within the frequency range before radiation. While the ADL 5523 GaAs LNA achieves a peak gain of 21.5 at 900 MHz; and it achieves approximately 15 GHz of gain, with a noise figure (NF) of 0.9 dB in the interested band of 2.3 GHz. Samples were irradiated with 3 MeV Electron doses ranging from 50 kGy to 250 kGy. The results show the increase of the NF and the drop of the gain of both LNAs which indicate that both SiGe and GaAs HBT technologies have been affected by the electron Irradiation. However, the GaAs LNA exhibits to be robust with a minimal degradation compare with the SiGe LNA, where it can still achieve a peak gain of 12 dB and a mean of Noise figure below 3 dB. However, the SiGe degraded with a drop of the gain down up to 7 dB and an increase of the Noise Figure above 3 dB within the frequency range. 
596 |a 1 
655 7 |a Theses, IIUM local 
690 |a Dissertations, Academic  |x Department of Electrical and Computer Engineering  |z IIUM 
710 2 |a International Islamic University Malaysia.  |b Department of Electrical and Computer Engineering 
856 4 |u http://studentrepo.iium.edu.my/handle/123456789/4411  |z Click here to view 1st 24 pages of the thesis. Members can view fulltext at the specified PCs in the library. 
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