Evaluation Of 28nm 10 Bit Adc Using Ramp And Sinusoidal Histogram Methodologies
ADC production testing has become more challenging due to more stringent test procedure for new generation of ADC. The trend for silicon cost is going down while the cost of test is going up. Therefore, to reduce the cost of test and preserve the test accuracy is essential for high volume testing in...
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| Main Author: | |
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| Format: | Thesis |
| Language: | English |
| Published: |
2015
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| Subjects: | |
| Online Access: | http://eprints.usm.my/40967/1/WAN_MOHD_FAHMI_BIN_WAN_ISMAIL_24_pages.pdf |
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